Scanning Electron Microscope

Tecnical specifications:

• field emission electron source
• resolution 1,0 nm pixel size at 1,0 kV accelerating voltage
• back scatted and secondary electron detectors and special lens design
• STEM detector for transmission electron microscopy application
• detector segments can be individually adjusted, allowing angular contrast or signal intensity optimisation for samples
• suitable for electron tomography of a large number of serial sections
• suitable for scanning microscopic examination of block face array samples in situ by ultramicrotome sectioning