TEM - Microscope H

Technical specifications:

• accelerating voltage range at 25-125 kV
• W-filament, electron source
• resolution 0,2 nm lattice image size and 0,45 nm particle image size
• magnification in zoom mode 1 000-600 000 x, in low magnification mode 50-1000 x
• manual tilted sample holder, maximum tilting angle at ±60°, sample tilting range with high contrast apperture at ±25°
• high resolution side mounted MegaView CCD camera. Fast "area of interest" search and imaging with iTEM software developed by Soft Imaging System
• applicable for TEM imaging of sectioned samples on 3 mm diameter copper grids