TEM - Microscope J

Technical specifications:

• accelerating voltage range at 40-100 kV
• W-filament, electron source
• resolution 0,2 nm lattice image size and 0,45 nm particle image size
• magnification in zoom mode at 600-500 000 x, in low magnification mode at 50-1 000 x
• manual tilted sample holder for two paralel grids, maximum tilting angle at ±60°
• high resolution bottom mounted TRS Sharp:Eye CCD camera. Fast area of interest search possibility and imaging with iTEM software developed by Soft Imaging System
• applicable for TEM imaging of sectioned samples on 3 mm diameter copper grids and replicas as well